Unlocking a new future for the semiconductor industry

Probe Cards

Probe Cards used for parametric testing
of wafer or film type packageProbe Cards used forparametric testing ofwafer or film typepackage

ICNL9381S_1D_CP (ND4S) (1124) (CO2502006WSH-R1)

ICNA3511WAA-1D-CP2-ND4C(COP) (2352) (CO2011019WSH)

ICNA3508_1D_FT (ND4C) (1693) (CO2405005WSH)

ICNA3311_4D_CP(ND3) (1800) (CO2108003WSH)

ICNL9390WAA_8D_CP (ND4C) (2152) (CO2410006WSH-R2)

ICNL9381S_8D_CP (ND4S) (1992) (CO2509008WSH-R1)

Promising a Bright Future EQ PROBE,
Opening a New Future for the Semiconductor Industry.Promising a BrightFuture EQ PROBE,Opening a New Futurefor the SemiconductorIndustry.

Probe Cards used for parametric testing of wafer or film type packageProbe Cards used for parametrictesting of wafer or film typepackage

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